Design for Testability (DFT) involves incorporating features into a VLSI design that make it easier to test after manufacturing. DFT techniques, such as scan chains, built-in self-test (BIST), and boundary scan, allow for efficient detection and diagnosis of manufacturing defects, ensuring high yield and reliability of the produced chips. DFT is crucial for reducing the cost and complexity of testing complex VLSI circuits, improving overall product quality and reliability.
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AMBA stands for Advanced Microcontroller Bus Architecture. What is a Microcontroller ?? A microcontroller is a small computer on a single ...
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In System Verilog, a thread or process is a segment of code that operates independently as a distinct entity. During the verification proces...
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Here, we will discuss CMOS fabrication of nMOS and pMOS structure on P-type substrate. The below diagram shows how nMOS and pMOS can ...
