What is the importance of Design for Testability (DFT) in VLSI?

Design for Testability (DFT) involves incorporating features into a VLSI design that make it easier to test after manufacturing. DFT techniques, such as scan chains, built-in self-test (BIST), and boundary scan, allow for efficient detection and diagnosis of manufacturing defects, ensuring high yield and reliability of the produced chips. DFT is crucial for reducing the cost and complexity of testing complex VLSI circuits, improving overall product quality and reliability.