Showing posts with label education. Show all posts
Showing posts with label education. Show all posts

February 23, 2025

Common Acronyms in VLSI & Semiconductor Industry

This post is a growing collection of commonly used acronyms in VLSI and semiconductor technology, along with their full forms. Keep checking back for updates!

General VLSI & Semiconductor Terms:

  • CMOS - Complementary Metal-Oxide-Semiconductor
  • ASIC - Application-Specific Integrated Circuit
  • FPGA - Field-Programmable Gate Array
  • RTL - Register Transfer Level
  • HLS - High-Level Synthesis
  • VHDL - Very High-Speed Integrated Circuit Hardware Description Language
  • HDL - Hardware Description Language
  • SoC - System-on-Chip
  • NoC - Network-on-Chip
  • DSP - Digital Signal Processing
  • RISC - Reduced Instruction Set Computing
  • IP - Intellectual Property

Fabrication & Process Technology:

  • MOSFET - Metal-Oxide-Semiconductor Field-Effect Transistor
  • BJT - Bipolar Junction Transistor
  • SOI - Silicon On Insulator
  • LVT - Low-Voltage Threshold
  • HVT - High-Voltage Threshold
  • GAA - Gate-All-Around
  • FEOL - Front-End of Line
  • BEOL - Back-End of Line
  • CMP - Chemical Mechanical Polishing
  • CVD - Chemical Vapour Deposition
  • PVD - Physical Vapour Deposition
  • LPCVD - Low-Pressure Chemical Vapour Deposition
  • EMIB - Embedded Multi-Die Interconnect Bridge

Memory & Storage:

  • SRAM - Static Random Access Memory
  • DRAM - Dynamic Random Access Memory
  • HBM - High-Bandwidth Memory
  • ROM - Read-Only Memory
  • EEPROM - Electrically Erasable Programmable Read-Only Memory
  • NVM - Non-Volatile Memory

Testing & Verification:

  • DFT - Design for Testability
  • ATPG - Automatic Test Pattern Generation
  • JTAG - Joint Test Action Group
  • BIST - Built-In Self-Test
  • MBIST - Memory Built-In Self-Test
  • LBIST - Logic Built-In Self-Test

EDA (Electronic Design Automation) & Design Flow:

  • EDA - Electronic Design Automation
  • PDK - Process Design Kit
  • GDSII - Graphic Data System II
  • SPICE - Simulation Program with Integrated Circuit Emphasis
  • STA - Static Timing Analysis
  • CTS - Clock Tree Synthesis
  • DRC - Design Rule Check
  • LVS - Layout vs Schematic
  • P&R - Place and Route
  • UPF - Unified Power Format

Packaging & Interconnects:

  • TSV - Through-Silicon Via
  • BGA - Ball Grid Array
  • QFP - Quad Flat Package
  • WLP - Wafer-Level Packaging
  • MCM - Multi-Chip Module

Power & Performance:

  • PPA - Power, Performance, and Area
  • DVFS - Dynamic Voltage and Frequency Scaling
  • IR - IR Drop (Voltage Drop due to Resistance)
  • EM - Electromigration

Semiconductor Chemicals & Materials:

  • Si - Silicon
  • GaAs - Gallium Arsenide
  • MoS2 - Molybdenum Disulfide 
  • SiO₂ - Silicon Dioxide 
  • Si₃N₄ - Silicon Nitride 
  • POCl₃ - Phosphorus Oxychloride 
  • BF₃ - Boron Trifluoride 
  • H₃PO₄ - Phosphoric Acid 
  • HF - Hydrofluoric Acid 
  • KOH - Potassium Hydroxide 
  • HNO₃ - Nitric Acid 
  • H₂O₂ - Hydrogen Peroxide 
  • NH₄OH - Ammonium Hydroxide 
  • WF₆ - Tungsten Hexafluoride 
  • AlCl₃ - Aluminum Chloride 
  • Cl₂ - Chlorine Gas

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